Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/30/2022
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Application #:
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16717475
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Filing Dt:
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12/17/2019
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Publication #:
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Pub Dt:
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04/16/2020
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Inventors:
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John Hench, Michael S. Bakeman, Andrei V. Shchegrov
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Title:
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COMPUTATIONALLY EFFICIENT X-RAY BASED OVERLAY MEASUREMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| JOSEPH SPANO |
| 851 BURLWAY ROAD |
| SUITE 407 |
| BURLINGAME, CA 94010 |
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