Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/13/2020
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Application #:
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16245695
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Filing Dt:
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01/11/2019
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Publication #:
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Pub Dt:
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07/16/2020
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Inventors:
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David Y. Wang, Alexander Buettner, Stilian Ivanov Pandev, Emanuel Saerchen et al
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Title:
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Semiconductor Metrology Based On Hyperspectral Imaging
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Assignment:
1
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CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBER OF THE PROPERTY CONVEYED, WHICH WAS INCORRECTLY LISTED AS 16/245,698 ON THE ORIGINAL COVER SHEET PREVIOUSLY RECORDED ON REEL 048495 FRAME 0974. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNORS INTEREST.
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| JOSEPH SPANO |
| 851 BURLWAY ROAD |
| SUITE 407 |
| BURLINGAME, CA 94010 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| JOSEPH S SPANO |
| 851 BURLWAY ROAD, SUITE 407 |
| BURLINGAME, CA 94010 |
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