Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/29/2021
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Application #:
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16574808
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Filing Dt:
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09/18/2019
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Publication #:
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Pub Dt:
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07/16/2020
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Inventors:
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Kyo-Min Sohn, Ki-Heung Kim, Young-Soo Sohn
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Title:
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INTEGRATED CIRCUIT MEMORY DEVICES HAVING BUFFER DIES AND TEST INTERFACE CIRCUITS THEREIN THAT SUPPORT TESTING AND METHODS OF TESTING SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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129, SAMSUNG-RO, YEONGTONG-GU |
GYEONGGI-DO |
SUWON-SI, KOREA, REPUBLIC OF 16677 |
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MYERS BIGEL, P.A. |
4140 PARKLAKE AVENUE |
SUITE 600 |
RALEIGH, NC 27612 |
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05/17/2024 07:50 PM
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