Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16759350
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Filing Dt:
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04/26/2020
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Publication #:
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Pub Dt:
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10/01/2020
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Inventors:
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Hua Wang, Zhiyong Zhang, Jianbo Ling, Jianhua Qi, Yuanhua Liu, Haiying Ji
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Title:
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OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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FIRST FLOOR, BUILDING 2, NO. 351 GUOSHOUJING ROAD |
PUDONG NEW AREA |
SHANGHAI, CHINA |
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IPRO, PLLC |
12332 TOWNCENTER PLAZA |
PMB# 816 |
STERLING, VA 20164 |
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04/28/2024 04:36 AM
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