Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/22/2021
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Application #:
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16920927
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Filing Dt:
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07/06/2020
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Publication #:
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Pub Dt:
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02/11/2021
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Inventors:
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Natsuki Tsuno, Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda et al
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Title:
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CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTION SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-6409 |
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| MILES & STOCKBRIDGE, P.C. |
| 1751 PINNACLE DR. |
| SUITE 1500 |
| TYSON'S CORNER, VA 22102 |
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