Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
07/05/2022
|
Application #:
|
16844183
|
Filing Dt:
|
04/09/2020
|
|
Publication #:
|
|
Pub Dt:
|
04/01/2021
| | | | |
|
Inventors:
|
Yuji EBIIKE, Yoshinori ITO, Koichi TAKAYAMA, Takaya NOGUCHI, Yoshikazu IKUTA
|
|
Title:
|
SEMICONDUCTOR TEST APPARATUS, SEMICONDUCTOR DEVICE TEST METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN 100-8310 |
|
|
|
|
| STUDEBAKER & BRACKETT PC |
| 8255 GREENSBORO DRIVE |
| SUITE 300 |
| TYSONS, VA 22102 |
|
|
Search Results as of:
05/08/2024 01:54 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
