Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/11/2022
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Application #:
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17078626
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Filing Dt:
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10/23/2020
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Publication #:
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Pub Dt:
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04/29/2021
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Inventors:
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Yasukazu NAKAE, Yasutaka SAKUMA, Shintaro KOBAYASHI, Takuto SAKUMURA
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Title:
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PROCESSING APPARATUS, SYSYEM, X-RAY MEASUREMENT METHOD, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-9-12, MATSUBARA-CHO |
| AKISHIMA-SHI, TOKYO, JAPAN 196-8666 |
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| BIRCH STEWART KOLASCH & BIRCH LLP |
| 8110 GATEHOUSE ROAD, SUITE 100E |
| FALLS CHURCH, VA 22042 |
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04/29/2024 12:59 AM
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