Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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05/14/2024
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Application #:
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17258056
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Filing Dt:
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01/05/2021
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Publication #:
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Pub Dt:
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06/03/2021
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Inventors:
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Yuichi Yamagishi, Kazumi Banno, Hiroyuki Kibe, Kunimitsu Toyoshima
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Title:
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An Inspection System Using Machine Learning To Label Image Segments Of Defects
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 134 AZA-KAWAHARA, TOYO, YORO-CHO, YORO-GUN |
| GIFU-KEN, JAPAN 503-1334 |
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| 1-10-30, KAIGAN, MINATO-KU |
| TOKYO, JAPAN 105-8660 |
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| 13-21, TAMADE-NISHI 2-CHOME, NISHINARI-KU, OSAKA-SHI |
| OSAKA, JAPAN 557-0045 |
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| SEAGER TUFTE & WICKHEM LLP |
| 100 SOUTH 5TH STREET #600 |
| MINNEAPOLIS, MN 55402 |
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