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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
11651509
Issue Dt:
05/16/2023
Application #:
17281948
Filing Dt:
03/31/2021
Publication #:
20210383529
Pub Dt:
12/09/2021
Inventors:
Roman KRIS, Sahar LEVIN, Ishai SCHWARZBAND, Roi MEIR, Grigory KLEBANOV, Efrat NOIFELD et al
Title:
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METROLOGY
Assignment: 1
Reel/Frame:
057759/0323Recorded: 10/08/2021Pages: 15
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
KRIS, ROMAN
Exec Dt:
11/18/2019
MEIR, ROI
Exec Dt:
02/25/2020
LEVIN, SAHAR
Exec Dt:
11/24/2019
SCHWARZBAND, ISHAI
Exec Dt:
11/18/2019
KLEBANOV, GRIGORY
Exec Dt:
11/18/2019
LEVI, SHIMON
Exec Dt:
10/22/2020
NOIFELD, EFRAT
Exec Dt:
11/19/2019
MIROKU, HIROSHI
Exec Dt:
08/12/2020
YOSHIZAWA, TAKU
Exec Dt:
12/07/2020
SAHA, KASTURI
Exec Dt:
02/25/2020
DUVDEVANI-BAR, SHARON
Exec Dt:
11/19/2019
VERESCHAGIN, VADIM
Exec Dt:
11/18/2019
Assignee:
APPLIED MATERIALS ISRAEL LTD.
9 OPPENHEIMER STREET
PARK RABIN
REHOVOT, ISRAEL 7670109
Correspondent:
LOWENSTEIN SANDLER LLP
ONE LOWENSTEIN DRIVE
ROSELAND, NJ 07068

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