Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/30/2024
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Application #:
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17366936
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Filing Dt:
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07/02/2021
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Publication #:
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Pub Dt:
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01/06/2022
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Inventor:
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Yasuhiro HIDAKA
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Title:
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ELLIPSOMETER AND INSPECTION DEVICE FOR INSPECTING SEMICONDUCTOR DEVICE HAVING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO |
| SUWON-SI, KOREA, REPUBLIC OF 16677 |
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| SUGHRUE MION, PLLC. |
| 2000 PENNSYLVANIA AVENUE, N.W. |
| 9TH FLOOR |
| WASHINGTON, DC 20006 |
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