Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17180919
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Filing Dt:
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02/22/2021
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Publication #:
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Pub Dt:
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03/03/2022
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Inventors:
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Mami KODAMA, Yoshikazu IIZUKA, Masahiro NOGUCHI, Yumiko WATANABE
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Title:
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FAILURE ANALYSIS SYSTEM OF SEMICONDUCTOR DEVICE, FAILURE ANALYSIS METHOD OF SEMICONDUCTOR DEVICE, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-21, SHIBAURA 3-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| OBLON, ET AL. |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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