Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/21/2023
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Application #:
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17085700
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Filing Dt:
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10/30/2020
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Publication #:
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Pub Dt:
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05/05/2022
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Inventors:
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Shannon Roy Campbell, Lukasz Redlarski
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Title:
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METROLOGY SYSTEM WITH PROJECTED PATTERN FOR POINTS-FROM-FOCUS TYPE PROCESSES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 20-1, SAKADO 1-CHOME, TAKATSU-KU, KAWASAKI-SHI |
| KANAGAWA-KEN, JAPAN 213-8533 |
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| SEED INTELLECTUAL PROPERTY LAW GROUP LLP |
| 701 FIFTH AVENUE |
| SUITE 5400 |
| SEATTLE, WA 98104 |
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