Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/23/2024
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Application #:
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17673131
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Filing Dt:
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02/16/2022
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Publication #:
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Pub Dt:
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06/02/2022
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Inventors:
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Daria Negri, Amnon Manassen, Gilad Laredo
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Title:
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METHOD OF MEASURING MISREGISTRATION IN THE MANUFACTURE OF TOPOGRAPHIC SEMICONDUCTOR DEVICE WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| HODGSON RUSS LLP |
| 140 PEARL STREET |
| SUITE 100 |
| BUFFALO, NY 14202-4040 |
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05/30/2024 02:53 PM
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