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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/07/2023
Application #:
17594431
Filing Dt:
10/15/2021
Publication #:
Pub Dt:
06/16/2022
Inventors:
Akeo SATOH, Kazunori NEMOTO, Akira KOTABE
Title:
Semiconductor Integrated Circuit Device and Inspection Method for Semiconductor Integrated Circuit Device
Assignment: 1
Reel/Frame:
057836/0791Recorded: 10/19/2021Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/09/2021
Exec Dt:
09/10/2021
Exec Dt:
08/09/2021
Assignee:
2520, TAKABA
HITACHINAKA-SHI, IBARAKI, JAPAN 312-8503
Correspondent:
CROWELL & MORING
P.O. BOX 14300
WASHINGTON, DC 20044-4300

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