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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17634805
Filing Dt:
02/11/2022
Publication #:
Pub Dt:
09/01/2022
Inventors:
Kei SAKAI, Ryou YUMIBA, Satoru YAMAGUCHI
Title:
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
Assignment: 1
Reel/Frame:
059892/0376Recorded: 05/11/2022Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/10/2021
Exec Dt:
12/10/2021
Exec Dt:
12/10/2021
Assignee:
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
CROWELL & MORING LLP INTELLECTUAL PROPER
P.O. BOX 14300
WASHINGTON, DC 20044-4300

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