Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17634805
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Filing Dt:
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02/11/2022
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Publication #:
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Pub Dt:
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09/01/2022
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Inventors:
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Kei SAKAI, Ryou YUMIBA, Satoru YAMAGUCHI
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Title:
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Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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17-1, TORANOMON 1-CHOME |
MINATO-KU, TOKYO, JAPAN |
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CROWELL & MORING LLP INTELLECTUAL PROPER |
P.O. BOX 14300 |
WASHINGTON, DC 20044-4300 |
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