Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/12/2024
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Application #:
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17641504
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Filing Dt:
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03/09/2022
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Publication #:
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Pub Dt:
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09/29/2022
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Inventor:
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Toshiki YAMADA
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Title:
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SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1126-1, ICHINO-CHO, HIGASHI-KU |
| HAMAMATSU-SHI, SHIZUOKA, JAPAN 435-8558 |
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| FAEGRE DRINKER BIDDLE & REATH LLP |
| 1500 K STREET, N.W. |
| SUITE 1100 |
| WASHINGTON, DC 20005-1209 |
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