Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17721949
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Filing Dt:
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04/15/2022
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Publication #:
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Pub Dt:
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10/20/2022
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Inventors:
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Xing WEI, Yun LIU, Zhongying XUE, Xun WANG
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Title:
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METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING AN INGOT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 1000, YUNSHUI RD., NICHENG TOWN, PUDONG NEW AREA |
| SHANGHAI, CHINA 201306 |
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| 865 CHANGNING ROAD |
| SHANGHAI, CHINA |
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| YING CHEN CHEN YOSHIMURA LLP |
| 750 W HAMILTON AVE |
| UNIT C |
| SAN PEDRO, CA 90731 |
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