Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17343804
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Filing Dt:
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06/10/2021
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Publication #:
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Pub Dt:
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10/20/2022
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Inventors:
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Hao-Xuan ZHENG, Fu-Yuan JIN, Mao-Chou TAI, Wei-Chen HUANG, Ting-Chang CHANG, Yu-Shan LIN et al
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Title:
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METHOD FOR DETECTING DEFECTS IN GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.70, LIEN-HAI RD., GUSHAN DIST. |
| KAOHSIUNG CITY, TAIWAN |
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| WPAT, PC INTELLECTUAL PROPERTY ATTORNEYS |
| 8230 BOONE BLVD, SUITE 405 |
| VIENNA, VA 22182 |
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