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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17716237
Filing Dt:
04/08/2022
Publication #:
Pub Dt:
10/20/2022
Inventors:
Yasushi EBIZUKA, Ryugo KAGETANI, Hiroyuki SHINDO
Title:
Defect Inspection Apparatus and Defect Inspection Method
Assignment: 1
Reel/Frame:
060593/0483Recorded: 07/22/2022Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/22/2022
Exec Dt:
03/18/2022
Exec Dt:
03/18/2022
Assignee:
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
CROWELL & MORING LLP
1001 PENNSYLVANIA AVENUE, NW
WASHINGTON, DC 20004

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