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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17694125
Filing Dt:
03/14/2022
Publication #:
Pub Dt:
10/27/2022
Inventors:
Osamu NABEYA, Keisuke NAMIKI, Shingo TOGASHI
Title:
FILM-THICKNESS MEASURING METHOD, METHOD OF DETECTING NOTCH PORTION, AND POLISHING APPARATUS
Assignment: 1
Reel/Frame:
059258/0159Recorded: 03/14/2022Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/18/2022
Exec Dt:
02/21/2022
Exec Dt:
02/21/2022
Assignee:
11-1, HANEDA ASAHI-CHO,OTA-KU
TOKYO, JAPAN 1448510
Correspondent:
BAKERHOSTETLER
1735 MARKET STREET
SUITE 3300
PHILADELPHIA, PA 19103-7501

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