Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17626819
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Filing Dt:
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01/13/2022
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Publication #:
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Pub Dt:
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11/03/2022
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Inventors:
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Xingji Li, Jianqun Yang, Xiaodong Xu, Gang Lv, Xiuhai Cui, Tao Ying, Yadong Wei
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Title:
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Detection Method for the Radiation-induced Defects of Oxide Layer in Electronic Devices
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO.92 XIDAZHI STREET, NANGANG DISTRICT, HEILONGJIANG |
| HARBIN, CHINA 150000 |
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| ANGELA HUANG |
| 19925 STEVENS CREEK BLVD., STE. 100 |
| CUPERTINO, CA 95014 |
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