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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17725339
Filing Dt:
04/20/2022
Publication #:
Pub Dt:
12/22/2022
Inventors:
Min-Yeong Moon, Stilian Ivanov Pandev
Title:
Methods And Systems For Measurement Of Tilt And Overlay Of A Structure
Assignment: 1
Reel/Frame:
060062/0052Recorded: 06/01/2022Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/24/2022
Exec Dt:
04/25/2022
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSEPH SPANO
851 BURLWAY ROAD
SUITE 407
BURLINGAME, CA 94010

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