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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/14/2023
Application #:
17473742
Filing Dt:
09/13/2021
Publication #:
Pub Dt:
12/29/2022
Inventors:
Min-Yeong Moon, Jonathan Madsen, Stilian Pandev, Andrei V. Shchegrov, Dimitry Sanko et al
Title:
SELF-CALIBRATED OVERLAY METROLOGY USING A SKEW TRAINING SAMPLE
Assignment: 1
Reel/Frame:
059255/0930Recorded: 03/14/2022Pages: 12
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/11/2022
Exec Dt:
11/02/2021
Exec Dt:
01/26/2022
Exec Dt:
01/26/2022
Exec Dt:
03/11/2022
Exec Dt:
11/02/2021
Exec Dt:
11/11/2021
Exec Dt:
11/19/2021
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
MATTHEW POULSEN, PHD.
SUITER SWANTZ INTELLECTUAL PROPERTY
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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