Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17895264
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Filing Dt:
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08/25/2022
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Publication #:
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Pub Dt:
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03/16/2023
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Inventors:
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Yuko SANO, Hiroyuki SHINDO, Masayoshi ISHIKAWA
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Title:
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Defect Inspection System and Defect Inspection Method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| CROWELL & MORING LLP |
| 1001 PENNSYLVANIA AVENUE, NW |
| WASHINGTON, DC 20004 |
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