Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18056511
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Filing Dt:
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11/17/2022
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Publication #:
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Pub Dt:
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03/16/2023
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Inventors:
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Koichi ISHII, Kazuhiko INOUE, Shohei MIKAMI, Toshikatsu AKIBA
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Title:
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MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8-1, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI |
| KANAGAWA, JAPAN 235-8522 |
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| OBLON, ET AL. |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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