Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17796376
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Filing Dt:
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07/29/2022
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Publication #:
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Pub Dt:
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03/16/2023
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Inventors:
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Kun YU, Zhiyong ZHANG, Jianhua QI, Yi WU, Yongjia WU, Yong NIU
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Title:
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SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMALIES BASED ON DEEP LEARNING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| KARAKAARI 7 |
| ESPOO, FINLAND 02610 |
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| SQUIRE PATTON BOGGS (US) LLP |
| 2550 M STREET, NW |
| WASHINGTON, DC 20037 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2ND FLOOR, BUILDING 2, NO.351 GUOSHOUJING ROAD., PUDONG NEW AREA, |
| SHANGHAI, CHINA 201203 |
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| MUNCY, GEISSLER, OLDS & LOWE, PC |
| 4000 LEGATO RD., SUITE 310 |
| FAIRFAX, VA 22033 |
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