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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17479870
Filing Dt:
09/20/2021
Publication #:
Pub Dt:
03/23/2023
Inventor:
Stilian Ivanov Pandev
Title:
Semiconductor Profile Measurement Based On A Scanning Conditional Model
Assignment: 1
Reel/Frame:
057745/0313Recorded: 10/08/2021Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/07/2021
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
JOSEPH SPANO
851 BURLWAY ROAD
SUITE 407
BURLINGAME, CA 94010

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