Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17659957
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Filing Dt:
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04/20/2022
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Publication #:
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Pub Dt:
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04/13/2023
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Inventors:
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Min-jung LEE, Huyndon JUNG
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Title:
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DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING SINGLE INCIDENT LIGHT-BASED PHOTOLUMINESCENCE AND DEFECT CLASSIFICATION METHOD USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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280-17, SANEOP-RO 155BEON-GIL, GWONSEON-GU |
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16648 |
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KNOBBE, MARTENS, OLSON & BEAR |
2040 MAIN STREET 14TH FLOOR |
IRVINE, CA 92614 |
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05/16/2024 06:36 PM
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