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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/19/2023
Application #:
18147091
Filing Dt:
12/28/2022
Publication #:
Pub Dt:
05/04/2023
Inventors:
Junichi Hagihara, Kunihiro Furuya, Naoki Muramatsu, Shigekazu Komatsu, Tadayoshi Hosaka
Title:
WAFER INSPECTION SYSTEM
Assignment: 1
Reel/Frame:
062222/0334Recorded: 12/28/2022Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/24/2019
Exec Dt:
10/25/2019
Exec Dt:
10/25/2019
Exec Dt:
10/24/2019
Exec Dt:
10/24/2019
Assignee:
3-1, AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-6325
Correspondent:
PEARNE & GORDON LLP
1801 EAST 9TH STREET, SUITE 1200
CLEVELAND, OH 44114

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