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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17891204
Filing Dt:
08/19/2022
Publication #:
Pub Dt:
06/22/2023
Inventors:
JONGHYUK KANG, SUYOUNG LEE, HONGCHE NOH, YUJIN CHO, INHYE PARK, CHUNGSAM JUN, JANGHEE LEE
Title:
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION METHOD USING THE SAME
Assignment: 1
Reel/Frame:
060998/0410Recorded: 09/06/2022Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/28/2022
Exec Dt:
07/28/2022
Exec Dt:
07/25/2022
Exec Dt:
07/28/2022
Exec Dt:
07/28/2022
Exec Dt:
07/28/2022
Exec Dt:
07/27/2022
Assignee:
129, SAMSUNG-RO, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16677
Correspondent:
MUIR PATENT LAW, PLLC
P.O. BOX 1213
GREAT FALLS, VA 22066

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