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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
17951776
Filing Dt:
09/23/2022
Publication #:
Pub Dt:
06/29/2023
Inventors:
Gangjiang LI, Youhui ZHANG, Song JIN
Title:
WAFER CHIP TESTING METHOD AND APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM
Assignment: 1
Reel/Frame:
061200/0228Recorded: 09/23/2022Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/30/2022
Exec Dt:
08/30/2022
Exec Dt:
08/30/2022
Assignee:
UNIT G2-2101, ARTIFICIAL INTELLIGENCE INDUSTRIAL PARK, NO. 88
JINJIHU AVENUE , SUZHOU INDUSTRIAL PARK , SUZHOU PILOT FREE TRADE ZONE, CHINA (JIANGSU),
JIANGSU, CHINA 210000
Correspondent:
DAVIS WRIGHT TREMAINE LLP
920 FIFTH AVENUE, SUITE 3300
SEATTLE, WA 98104-1610

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