Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17732884
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Filing Dt:
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04/29/2022
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Publication #:
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Pub Dt:
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08/17/2023
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Inventor:
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Woo Young PARK
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Title:
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METHOD FOR DETERMINING FINE PARTICLE DEFECTS ON SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 53 IMSU-RO, GUMI-SI, |
| GYEONGSANGBUK-DO, KOREA, REPUBLIC OF 39386 |
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| KED & ASSOCIATES, LLP |
| P.O. BOX 8638 |
| RESTON, VA 20195 |
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