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Patent Assignment Abstract of Title

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Total Assignments: 1

Patent #:	NONE	Issue Dt:		Application #:	17830513	Filing Dt:	06/02/2022
Publication #:	20230394492	Pub Dt:	12/07/2023
Inventors:	Ajeet SINGH, Gopal Datt JOSHI, Jeffrey Yale ALPERT, Amar KUMAR, Naveen TEWARI et al
Title:	AI-BASED DEFECT DIAGNOSIS SYSTEM AND METHOD

Assignment: 1

Reel/Frame:

060080/0493

Recorded: 06/02/2022

Pages: 9

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

JOSHI, GOPAL DATT

Exec Dt:

05/23/2022

SINGH, AJEET

Exec Dt:

05/23/2022

ALPERT, JEFFREY YALE

Exec Dt:

05/25/2022

TEWARI, NAVEEN

Exec Dt:

05/26/2022

KUMAR, AMAR

Exec Dt:

05/23/2022

KALPANDE, ABHIJEET GANESH

Exec Dt:

05/23/2022

LANJEWAR, KETAN

Exec Dt:

05/23/2022

BOTCHA, DILEEP KUMAR

Exec Dt:

05/23/2022

Assignee:

NOODLE ANALYTICS, INC.

115 SANSOME STREET, SUITE 800

SAN FRANCISCO, CALIFORNIA 94104

Correspondent:

HARNESS, DICKEY & PIERCE, P.L.C.

P.O. BOX 8910

RESTON, VA 20195

Search Results as of: 06/13/2024 11:58 PM

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