Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18333209
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Filing Dt:
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06/12/2023
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Publication #:
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Pub Dt:
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12/28/2023
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Inventors:
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Yong Hyun KIM, Jae Hoon JOO, Hyo Sang JO, Ki Young JEON
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Title:
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SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO SEMICONDUCTOR WAFER TEST APPARATUS AND METHOD OF CONTROLLING SUPPLY OF POWER TO SEMICONDUCTOR WAFER TEST APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 29 PANGYO-RO 255BEON-GIL, BUNDANG-GU |
| SEONGNAM-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 13486 |
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| HARNESS, DICKEY & PIERCE, P.L.C. |
| P.O. BOX 8910 |
| RESTON, VA 20195 |
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