Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18269365
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Filing Dt:
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06/23/2023
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Publication #:
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Pub Dt:
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02/22/2024
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Inventors:
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Mao HIRATA, Akimitsu TANABE
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Title:
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LEAK TEST CONDITION DESIGN METHOD, LEAK TEST CONDITION DESIGN DEVICE, LEAK TESTING METHOD, AND LEAK TESTING DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 16-5, NUKUI 3-CHOME, NERIMA-KU |
| TOKYO, JAPAN 1760021 |
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| KANESAKA BERNER AND PARTNERS LLP |
| 2318 MILL ROAD |
| SUITE 1400 |
| ALEXANDRIA, VA 22314-2848 |
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