Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18259749
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Filing Dt:
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06/28/2023
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Publication #:
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Pub Dt:
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02/22/2024
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Inventors:
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Takako ONISHI, Takayuki NISHI, Shimpei FUJII, Hironori KASAHARA, Yuji KARITA et al
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Title:
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MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREMENT METHOD, INSPECTION METHOD, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 801, MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU |
| SHIOKOJI-DORI, SHIMOGYO-KU |
| KYOTO-SHI, KYOTO, JAPAN 600-8530 |
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| ROSSI KIMMS & MCDOWELL LLP |
| 20609 GORDON PARK SQUARE, SUITE 150 |
| ASHBURN, VA 20147 |
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05/14/2024 11:42 AM
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