Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17823235
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Filing Dt:
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08/30/2022
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Publication #:
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Pub Dt:
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02/29/2024
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Inventors:
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Kiarash Ahi, Germain Louis Fenger, Hsin-Wei Wu
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Title:
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WAFER IMAGE DEFECT DETECTION AND CHARACTERIZATION FOR MANUFACTURING PROCESS CALIBRATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| INTERLEUVENLAAN 68 |
| LEUVEN, BELGIUM 3001 |
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| SIEMENS CORPORATION |
| 3850 QUADRANGLE BLVD. |
| IP DEPT - MAIL CODE INT-244 |
| ORLANDO, FL 32817 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5800 GRANITE PARKWAY, SUITE 600 |
| PLANO, TEXAS 75024 |
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| SIEMENS CORPORATION |
| 3850 QUADRANGLE BLVD. |
| IP DEPT - MAIL CODE INT-244 |
| ORLANDO, FL 32817 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| EAST PARK SHANNON FREE ZONE |
| SHANNON, IRELAND V14 YD96 |
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| SIEMENS CORPORATION |
| 3850 QUADRANGLE BLVD. |
| IP DEPT - MAIL CODE INT-244 |
| ORLANDO, FL 32817 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5800 GRANITE PARKWAY |
| SUITE 600 |
| PLANO, TEXAS 75024 |
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| SIEMENS CORPORATION |
| 3850 QUADRANGLE BLVD. |
| IP DEPT - MAIL CODE INT-244 |
| ORLANDO, FL 32817 |
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05/15/2024 01:06 AM
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