Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18376579
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Filing Dt:
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10/04/2023
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Publication #:
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Pub Dt:
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04/04/2024
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Inventors:
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Brandon Hirsch, Matthew Keller, Stephen Becker, Michael A. Samp
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Title:
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APPARATUS AND METHODS FOR LEAK TESTING OF HERMETIC MICROELECTRONICS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 875 N. RANDOLPH ST. |
| OFFICE OF NAVAL RESEARCH, ROOM 522, ATTN: CODE OOCCIP |
| ARLINGTON, VIRGINIA 22203-1995 |
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| CHRISTOPHER FEIGENBUTZ |
| 300 HWY 361 |
| NSWC CRANE, 00L BLDG 2 |
| CRANE, IN 47522-5001 |
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