Patent Assignment Details
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| Reel/Frame: | 004101/0087 | |
| Pages: | 1 |
| | Recorded: | 03/08/1983 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/26/1983
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Application #:
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06202240
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Filing Dt:
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10/30/1980
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Title:
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METHOD FOR AUTOMATIC, NON-DESTRUCTIVE MEASUREMENT OF ECCENTRICITY OF COATED ELECTRODES
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Assignee
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| 3-18, 1-CHOME, WAKINOHAMA-CHO, FUKIAI-KU, |
| KOBE-SHI, |
| HYOGO,, JAPAN |
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Correspondence name and address
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OBLON, FISHER, SPIVAK,
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MC CLELLAND & MAIER
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CRYSTAL SQ. 5 - STE. 400
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1755 S. JEFF. DAVIS HWY.
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ARLINGTON, VA 22202
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