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Patent Assignment Details
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Reel/Frame:005213/0120   Pages: 2
Recorded: 12/14/1989
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST.
Total properties: 14
1
Patent #:
Issue Dt:
07/07/1981
Application #:
06105892
Filing Dt:
12/21/1979
Title:
APPARATUS AND METHOD FOR CONTACT-FREE POTENTIAL MEASUREMENTS OF AN ELECTRINIC COMPOSITION
2
Patent #:
Issue Dt:
12/04/1984
Application #:
06284828
Filing Dt:
07/20/1981
Title:
ELECTRON BEAM TESTING DEVICE FOR STROBOSCOPIC MEASUREMENT OF HIGH-FREQUENCY, PERIODIC EVENTS
3
Patent #:
Issue Dt:
11/01/1983
Application #:
06287134
Filing Dt:
07/27/1981
Title:
ARRANGEMENT FOR STROBOSCOPIC POTENTIAL MEASUREMENTS WITH AN ELECTRON BEAM TESTING DEVICE
4
Patent #:
Issue Dt:
09/11/1984
Application #:
06341106
Filing Dt:
01/20/1982
Title:
METHOD FOR REPRESENTING LOGICAL STATUS CHANGES OF A PLURALITY OF ADJACENT CIRCUIT NODES IN AN INTEGRATED CIRCUIT IN A LOGIC IMAGE EMPLOYING A PULSED ELECTRON PROBE
5
Patent #:
Issue Dt:
08/07/1984
Application #:
06409630
Filing Dt:
08/19/1982
Title:
OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
6
Patent #:
Issue Dt:
11/18/1986
Application #:
06693231
Filing Dt:
01/22/1985
Title:
SAMPLING METHOD FOR FAST POTENTIAL DETERMINATION IN ELECTRON BEAM MENSURATION
7
Patent #:
Issue Dt:
06/23/1987
Application #:
06706105
Filing Dt:
02/27/1985
Title:
METHOD FOR AUTOMATICALLY SETTING AN OPERATING POINT GIVEN SIGNAL CURVE MEASUREMENTS WITH A PARTICLE BEAM MEASURING APPARATUS
8
Patent #:
Issue Dt:
12/15/1987
Application #:
06751020
Filing Dt:
07/02/1985
Title:
SCANNING PARTICLE MICROSCOPE
9
Patent #:
Issue Dt:
11/29/1988
Application #:
06845517
Filing Dt:
03/28/1986
Title:
METHOD FOR THE INDIRECT IDENTIFICATION OF THE INTENSITY DISTRIBUTION OF PARTICLE BEAM PULSES GENERATED IN A PARTICLE BEAM MEASURING INSTRUMENT
10
Patent #:
Issue Dt:
02/28/1989
Application #:
06874498
Filing Dt:
06/16/1986
Title:
SPECTROMETER OBJECTIVE FOR ELECTRON BEAM MENSURATION TECHNIQUES
11
Patent #:
Issue Dt:
11/15/1988
Application #:
07030964
Filing Dt:
03/27/1987
Title:
ELECTROSTATIC-MAGNETIC LENS FOR PARTICLE BEAM APPARATUS
12
Patent #:
Issue Dt:
03/01/1988
Application #:
07041654
Filing Dt:
04/21/1987
Title:
LOW-ABBERATION SPECTROMETER OBJECTIVE WITH HIGH SECONDARY ELECTRON ACCEPTANCE
13
Patent #:
Issue Dt:
03/14/1989
Application #:
07120133
Filing Dt:
11/13/1987
Title:
SPECTROMETER OBJECTIVE FOR PARTICLE BEAM MEASURING INSTRUMENTS
14
Patent #:
Issue Dt:
05/16/1989
Application #:
07130028
Filing Dt:
12/08/1987
Title:
DETECTOR OBJECTIVE FOR PARTICLE BEAM APPARATUS
Assignor
1
Exec Dt:
10/09/1989
Assignee
1
HEIMSTETTEN, GERMANY D-8011
Correspondence name and address
HILL, VAN SANTEN, STEADMAN,
CHIARA & SIMPSON
70TH FLOOR, SEARS TOWER
CHICAGO, IL 60606

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