Total properties:
14
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Patent #:
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Issue Dt:
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07/07/1981
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Application #:
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06105892
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Filing Dt:
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12/21/1979
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Title:
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APPARATUS AND METHOD FOR CONTACT-FREE POTENTIAL MEASUREMENTS OF AN ELECTRINIC COMPOSITION
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Patent #:
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Issue Dt:
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12/04/1984
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Application #:
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06284828
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Filing Dt:
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07/20/1981
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Title:
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ELECTRON BEAM TESTING DEVICE FOR STROBOSCOPIC MEASUREMENT OF HIGH-FREQUENCY, PERIODIC EVENTS
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Patent #:
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Issue Dt:
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11/01/1983
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Application #:
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06287134
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Filing Dt:
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07/27/1981
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Title:
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ARRANGEMENT FOR STROBOSCOPIC POTENTIAL MEASUREMENTS WITH AN ELECTRON BEAM TESTING DEVICE
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Patent #:
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Issue Dt:
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09/11/1984
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Application #:
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06341106
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Filing Dt:
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01/20/1982
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Title:
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METHOD FOR REPRESENTING LOGICAL STATUS CHANGES OF A PLURALITY OF ADJACENT CIRCUIT NODES IN AN INTEGRATED CIRCUIT IN A LOGIC IMAGE EMPLOYING A PULSED ELECTRON PROBE
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Patent #:
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Issue Dt:
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08/07/1984
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Application #:
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06409630
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Filing Dt:
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08/19/1982
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Title:
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OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
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Patent #:
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Issue Dt:
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11/18/1986
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Application #:
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06693231
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Filing Dt:
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01/22/1985
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Title:
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SAMPLING METHOD FOR FAST POTENTIAL DETERMINATION IN ELECTRON BEAM MENSURATION
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Patent #:
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Issue Dt:
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06/23/1987
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Application #:
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06706105
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Filing Dt:
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02/27/1985
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Title:
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METHOD FOR AUTOMATICALLY SETTING AN OPERATING POINT GIVEN SIGNAL CURVE MEASUREMENTS WITH A PARTICLE BEAM MEASURING APPARATUS
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Patent #:
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Issue Dt:
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12/15/1987
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Application #:
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06751020
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Filing Dt:
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07/02/1985
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Title:
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SCANNING PARTICLE MICROSCOPE
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Patent #:
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Issue Dt:
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11/29/1988
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Application #:
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06845517
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Filing Dt:
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03/28/1986
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Title:
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METHOD FOR THE INDIRECT IDENTIFICATION OF THE INTENSITY DISTRIBUTION OF PARTICLE BEAM PULSES GENERATED IN A PARTICLE BEAM MEASURING INSTRUMENT
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Patent #:
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Issue Dt:
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02/28/1989
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Application #:
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06874498
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Filing Dt:
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06/16/1986
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Title:
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SPECTROMETER OBJECTIVE FOR ELECTRON BEAM MENSURATION TECHNIQUES
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Patent #:
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Issue Dt:
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11/15/1988
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Application #:
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07030964
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Filing Dt:
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03/27/1987
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Title:
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ELECTROSTATIC-MAGNETIC LENS FOR PARTICLE BEAM APPARATUS
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Patent #:
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Issue Dt:
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03/01/1988
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Application #:
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07041654
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Filing Dt:
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04/21/1987
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Title:
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LOW-ABBERATION SPECTROMETER OBJECTIVE WITH HIGH SECONDARY ELECTRON ACCEPTANCE
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Patent #:
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Issue Dt:
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03/14/1989
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Application #:
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07120133
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Filing Dt:
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11/13/1987
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Title:
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SPECTROMETER OBJECTIVE FOR PARTICLE BEAM MEASURING INSTRUMENTS
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Patent #:
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Issue Dt:
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05/16/1989
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Application #:
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07130028
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Filing Dt:
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12/08/1987
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Title:
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DETECTOR OBJECTIVE FOR PARTICLE BEAM APPARATUS
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