Patent Assignment Details
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| Reel/Frame: | 005248/0790 | |
| Pages: | 1 |
| | Recorded: | 03/09/1990 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/18/1992
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Application #:
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07491089
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Filing Dt:
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03/09/1990
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Title:
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DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD OF TESTING THE SAME
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Assignee
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| 1006 OAZA KADOMA, KADOMA-SHI |
| A CORP. OF JAPAN |
| OSAKA, JAPAN |
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Correspondence name and address
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SIXBEY, FRIEDMAN, LEEDOM, ET AL
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ONE SKYLINE PLACE
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5205 LEESBURG PIKE, SUITE 310
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FALLS CHURCH, VA 22041
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