Patent Assignment Details
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| Reel/Frame: | 006055/0663 | |
| Pages: | 2 |
| | Recorded: | 03/13/1992 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/07/1995
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Application #:
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07850916
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Filing Dt:
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03/13/1992
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Title:
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METHOD FOR TESTING QUALITY OF SILICON WAFER
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Assignee
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| A CORPORATION OF JAPAN |
| 4-2, MARUNOUCHI 1 CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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TOWNSEND, SNIDER & BANTA
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TERESA J. BANTA
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1225 EYE ST., N.W. STE. 500
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WASHINGTON, DC 20007
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