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Patent Assignment Details
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Reel/Frame:006339/0735   Pages: 4
Recorded: 11/05/1992
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST.
Total properties: 1
1
Patent #:
Issue Dt:
05/17/1994
Application #:
07923500
Filing Dt:
08/03/1992
Title:
METHOD AND APPARATUS FOR MEASURING DEVIATION BETWEEN PATTERNS ON A SEMICONDUCTOR WAFER
Assignors
1
Exec Dt:
10/22/1992
2
Exec Dt:
10/22/1992
3
Exec Dt:
10/22/1992
4
Exec Dt:
10/22/1992
Assignee
1
30-2, 3-CHOME, SHIMOMARUKO, OHTA-KU
TOKYO, JAPAN
Correspondence name and address
GARY M. JACOBS
FITZPATRICK, CELLA, HARPER & SCINTO
277 PARK AVENUE
NEW YORK, NY 10172-0194

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