Patent Assignment Details
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| Reel/Frame: | 006381/0864 | |
| Pages: | 3 |
| | Recorded: | 09/30/1992 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/21/1995
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Application #:
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07954200
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Filing Dt:
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09/30/1992
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Title:
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SEMICONDUCTOR WAFER DEFECT MONITORING
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Assignee
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| 1109 MCKAY DRIVE, MS/45 |
| SAN JOSE, CALIFORNIA 95131 |
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Correspondence name and address
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WILLIAM G. BECKER
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VLSI TECHNOLOGY, INC.
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1109 MCKAY DRIVE, MS-45
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SAN JOSE, CA 95131
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