Patent Assignment Details
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Reel/Frame: | 006454/0373 | |
| Pages: | 3 |
| | Recorded: | 03/08/1993 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/06/1994
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Application #:
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08027639
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Filing Dt:
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03/08/1993
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Title:
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OPTICAL APPARATUS INCLUDING COMPONENTS HAVING SPECTRALLY OVERLAPPING CHARACTERISTICS FOR MEASURING SEMICONDUCTOR LAYER THICKNESS
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Assignees
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2-3, MARUNOUCHI |
2-CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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2967-5, ISHIKAWA-CHO |
HACHIOJI-SHI |
TOKYO, JAPAN |
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Correspondence name and address
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JEFFREY A. WYAND
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LEYDIG VOIT & MAYER
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700 THIRTEENTH STREET, N.W., STE.300
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WASHINGTON, D.C. 20005
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