Patent Assignment Details
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| Reel/Frame: | 006678/0015 | |
| Pages: | 3 |
| | Recorded: | 08/31/1993 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/05/1996
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Application #:
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08113689
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Filing Dt:
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08/31/1993
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Title:
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SEMICONDUCTOR TESTING APPARATUS, SEMICONDUCTOR TESTING CIRCUIT CHIP, AND PROBE CARD
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Assignee
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| 1006 OAZA KADOMA KADOMA-SHI, OSAKA 571, JAPAN |
| JAPAN |
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Correspondence name and address
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KENNETH L. CAGE, ESQ.
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WILLIAN BRINKS OLDS
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HOFER GILSON & LIONE
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2000 K STREET, N.W., SUITE 200
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WASHINGTON, DC 20006-1809
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