Patent Assignment Details
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| Reel/Frame: | 006742/0474 | |
| Pages: | 10 |
| | Recorded: | 06/10/1993 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/13/1994
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Application #:
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29006815
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Filing Dt:
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04/07/1993
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Title:
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SEMICONDUCTOR WAFER TESTING APPARATUS
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Assignees
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| 3-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO, JAPAN |
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| 2831-1, FUJII-MACHI KITAGEJ |
| NIRASAKI-SHI, YAMANASHI-KEN, JAPAN |
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Correspondence name and address
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LADAS & PARRY
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ITARU TAKAO
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26 WEST 61ST STREET
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NEW YORK, NY 10023
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