Patent Assignment Details
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| Reel/Frame: | 006855/0814 | |
| Pages: | 2 |
| | Recorded: | 01/14/1994 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/18/1996
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Application #:
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08181584
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Filing Dt:
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01/14/1994
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Title:
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IC ANALYSIS SYSTEM AND ELECTRON BEAM PROBE SYSTEM AND FAULT ISOLATION METHOD THEREFOR
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Assignee
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| 32-1, ASAHI-CHO 1-CHOME NERIMA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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STAAS & HALSEY
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JAMES D. HALSEY, JR.
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1825 K STREET, N.W., SUITE 816
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WASHINGTON, D.C. 20006
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