Total properties:
12
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Patent #:
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Issue Dt:
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01/15/1991
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Application #:
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06813875
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Filing Dt:
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12/27/1985
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Title:
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PARTICLE BEAM MEASURING METHOD FOR NON-CONTACT TESTING OF INTERCONNECT NETWORKS
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Patent #:
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Issue Dt:
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12/22/1987
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Application #:
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06895310
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Filing Dt:
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08/11/1986
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Title:
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ARRANGEMENT FOR DETECTING SECONDARY AND/OR BACKSCATTER ELECTRONS IN AN ELECTRON BEAM APPARATUS
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Patent #:
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Issue Dt:
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01/08/1991
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Application #:
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07393221
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Filing Dt:
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08/14/1989
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Title:
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DEVICE FOR THE DETECTING OF CHARGED SECONDARY PARTICLES
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Patent #:
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Issue Dt:
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09/04/1990
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Application #:
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07416996
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Filing Dt:
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10/02/1989
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Title:
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METHOD FOR EXAMINING A SPECIMEN IN A PARTICLE BEAM INSTRUMENT
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Patent #:
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Issue Dt:
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04/21/1992
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Application #:
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07449080
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Filing Dt:
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12/08/1989
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Title:
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APPARATUS FOR MODULATING A PARTICLE BEAM INTENSITY
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Patent #:
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Issue Dt:
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09/08/1992
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Application #:
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07691238
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Filing Dt:
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04/25/1991
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Title:
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PARTICLE BEAM APPARATUS HAVING AN IMMERSION LENS ARRANGED IN AN INTERMEDIATE IMAGE OF THE BEAM
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Patent #:
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Issue Dt:
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12/07/1993
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Application #:
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07882657
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Filing Dt:
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05/13/1992
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Title:
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METHOD FOR PARTICLE BEAM TESTING OF SUBSTRATES FOR LIQUID CRYSTAL DISPLAYS (LCD)
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Patent #:
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Issue Dt:
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11/02/1993
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Application #:
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07906564
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Filing Dt:
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06/29/1992
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Title:
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METHOD FOR THE RECOGNITION OF TESTING ERRORS IN THE TEST OF MICROWIRINGS
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Patent #:
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Issue Dt:
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11/29/1994
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Application #:
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07947520
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Filing Dt:
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09/21/1992
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Title:
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PARTICLE BEAM TESTING METHOD WITH COUNTERVOLTAGE OR RETARDING VOLTAGE FOLLOW-UP OR FEEDBACK
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Patent #:
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Issue Dt:
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12/13/1994
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Application #:
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08105760
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Filing Dt:
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08/13/1993
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Title:
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METHOD FOR THE RECOGNITION OF TESTING ERRORS IN THE TEST OF MICROWIRINGS
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Patent #:
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Issue Dt:
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05/09/1995
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Application #:
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08123218
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Filing Dt:
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09/20/1993
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Title:
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METHOD FOR PARTICLE BEAM TESTING OF SUBSTRATES FOR LIQUID CRYSTAL DISPLAYS (LCD)
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Patent #:
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Issue Dt:
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12/06/1994
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Application #:
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08123261
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Filing Dt:
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09/20/1993
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Title:
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METHOD FOR PARTICLE BEAM TESTING OF SUBSTRATES FOR LIQUID CRYSTAL DISPLAYS USING PARASITIC CURRENTS
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