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Patent Assignment Details
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Reel/Frame:007588/0954   Pages: 2
Recorded: 08/23/1995
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 26
1
Patent #:
Issue Dt:
09/02/1980
Application #:
06022484
Filing Dt:
03/21/1979
Title:
METHOD FOR THE CONTACTLESS MEASUREMENT OF THE POTENTIAL WAVEFORM IN AN ELECTRONIC COMPONENT AND APPARATUS FOR IMPLEMENTING THE METHOD
2
Patent #:
Issue Dt:
07/07/1981
Application #:
06105892
Filing Dt:
12/21/1979
Title:
APPARATUS AND METHOD FOR CONTACT-FREE POTENTIAL MEASUREMENTS OF AN ELECTRINIC COMPOSITION
3
Patent #:
Issue Dt:
12/04/1984
Application #:
06284828
Filing Dt:
07/20/1981
Title:
ELECTRON BEAM TESTING DEVICE FOR STROBOSCOPIC MEASUREMENT OF HIGH-FREQUENCY, PERIODIC EVENTS
4
Patent #:
Issue Dt:
11/01/1983
Application #:
06287134
Filing Dt:
07/27/1981
Title:
ARRANGEMENT FOR STROBOSCOPIC POTENTIAL MEASUREMENTS WITH AN ELECTRON BEAM TESTING DEVICE
5
Patent #:
Issue Dt:
09/11/1984
Application #:
06341106
Filing Dt:
01/20/1982
Title:
METHOD FOR REPRESENTING LOGICAL STATUS CHANGES OF A PLURALITY OF ADJACENT CIRCUIT NODES IN AN INTEGRATED CIRCUIT IN A LOGIC IMAGE EMPLOYING A PULSED ELECTRON PROBE
6
Patent #:
Issue Dt:
08/07/1984
Application #:
06409630
Filing Dt:
08/19/1982
Title:
OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
7
Patent #:
Issue Dt:
11/18/1986
Application #:
06693231
Filing Dt:
01/22/1985
Title:
SAMPLING METHOD FOR FAST POTENTIAL DETERMINATION IN ELECTRON BEAM MENSURATION
8
Patent #:
Issue Dt:
06/23/1987
Application #:
06706105
Filing Dt:
02/27/1985
Title:
METHOD FOR AUTOMATICALLY SETTING AN OPERATING POINT GIVEN SIGNAL CURVE MEASUREMENTS WITH A PARTICLE BEAM MEASURING APPARATUS
9
Patent #:
Issue Dt:
12/15/1987
Application #:
06751020
Filing Dt:
07/02/1985
Title:
SCANNING PARTICLE MICROSCOPE
10
Patent #:
Issue Dt:
11/17/1992
Application #:
06753555
Filing Dt:
07/10/1985
Title:
METHOD AND APPARATUS FOR ANALYZING ERRORS IN INTEGRATED CIRCUITS
11
Patent #:
Issue Dt:
07/28/1987
Application #:
06773863
Filing Dt:
09/09/1985
Title:
OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
12
Patent #:
Issue Dt:
11/29/1988
Application #:
06845517
Filing Dt:
03/28/1986
Title:
METHOD FOR THE INDIRECT IDENTIFICATION OF THE INTENSITY DISTRIBUTION OF PARTICLE BEAM PULSES GENERATED IN A PARTICLE BEAM MEASURING INSTRUMENT
13
Patent #:
Issue Dt:
02/28/1989
Application #:
06874498
Filing Dt:
06/16/1986
Title:
SPECTROMETER OBJECTIVE FOR ELECTRON BEAM MENSURATION TECHNIQUES
14
Patent #:
Issue Dt:
11/15/1988
Application #:
07030964
Filing Dt:
03/27/1987
Title:
ELECTROSTATIC-MAGNETIC LENS FOR PARTICLE BEAM APPARATUS
15
Patent #:
Issue Dt:
03/01/1988
Application #:
07041654
Filing Dt:
04/21/1987
Title:
LOW-ABBERATION SPECTROMETER OBJECTIVE WITH HIGH SECONDARY ELECTRON ACCEPTANCE
16
Patent #:
Issue Dt:
03/14/1989
Application #:
07120133
Filing Dt:
11/13/1987
Title:
SPECTROMETER OBJECTIVE FOR PARTICLE BEAM MEASURING INSTRUMENTS
17
Patent #:
Issue Dt:
06/20/1989
Application #:
07161758
Filing Dt:
02/29/1988
Title:
METHOD FOR TESTING CONDUCTOR NETWORKS
18
Patent #:
Issue Dt:
05/15/1990
Application #:
07318970
Filing Dt:
03/06/1989
Title:
OBJECTIVE LENS FOR FOCUSING CHARGED PARTICLES IN AN ELECTRON MICROSCOPE
19
Patent #:
Issue Dt:
08/20/1991
Application #:
07419458
Filing Dt:
10/10/1989
Title:
METHOD OF OPERATING AN ELECTRON BEAM MEASURING DEVICE
20
Patent #:
Issue Dt:
04/21/1992
Application #:
07449080
Filing Dt:
12/08/1989
Title:
APPARATUS FOR MODULATING A PARTICLE BEAM INTENSITY
21
Patent #:
Issue Dt:
10/29/1991
Application #:
07612507
Filing Dt:
11/14/1990
Title:
CORPUSCULAR BEAM DEVICE
22
Patent #:
Issue Dt:
07/27/1993
Application #:
07626944
Filing Dt:
12/13/1990
Title:
METHOD AND APPARATUS FOR POTENTIAL MEASUREMENT ON CONDUCTIVE TRACKS OF A PROGRAM-CONTROLLED INTEGRATED CIRCUIT
23
Patent #:
Issue Dt:
09/08/1992
Application #:
07631472
Filing Dt:
12/20/1990
Title:
ION BEAM DEVICE AND METHOD FOR CARRYING OUT POTENTIAL MEASUREMENTS BY MEANS OF AN ION BEAM
24
Patent #:
Issue Dt:
05/25/1993
Application #:
07744933
Filing Dt:
08/14/1991
Title:
METHOD AND ARRAGEMENT FOR TESTING AND REPAIRING AN INTEGRATED CIRCUIT
25
Patent #:
Issue Dt:
06/06/1995
Application #:
08058959
Filing Dt:
05/07/1993
Title:
SCANNING ELECTRON BEAM DEVICE
26
Patent #:
Issue Dt:
06/10/1997
Application #:
08342743
Filing Dt:
11/21/1994
Title:
METHOD AND APPARATUS FOR PROCESSING A SPECIMEN
Assignor
1
Exec Dt:
07/21/1995
Assignee
1
TOKYO, JAPAN
Correspondence name and address
LEARMAN & MCCULLOCH
JOHN K. MCCULLOCH
5291 COLONY DRIVE NORTH
SAGINAW, MI 48603

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